This paper describes a study of EHD film thickness in non-steady state contact conditions. A modification of ultrathin film interferometry is employed which is able to measure both central film thickness and film thickness profiles 50 times a second. Film thickness with two perfluoropolyethers and two mineral base oils are investigated in a number of different types of non-steady state motion, including acceleration/deceleration, stop/start and reciprocation. The results demonstrate a range of transient behaviors of EHD film whose thicknesses deviate from those in steady state conditions.
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EHD Film Thickness in Non-Steady State Contacts
W. R. Jones, Jr.,
Department of Energy and Mechanical Engineering, Kyushu University, Hakozaki, Higashi-ku, Fukuoka 812-81, Japan
W. R. Jones, Jr.
NASA Lewis Research Center, Cleveland, OH 44135
H. A. Spikes
Tribology Section, Imperial College, Exhibition Road, London SW7 2BX, United Kingdom
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Sugimura, J., Jones, W. R., Jr., and Spikes, H. A. (July 1, 1998). "EHD Film Thickness in Non-Steady State Contacts." ASME. J. Tribol. July 1998; 120(3): 442–452. https://doi.org/10.1115/1.2834569
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