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Lisa Shellenberger
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Proceedings Papers

Construction of a Broad-Based Experimental and Computational Test Capability for High Power Wide Bandgap Semiconductor Devices

Jason A. Carter, Matthew D. Roth, Michael W. Horgan, Lisa Shellenberger, Daniel P. Hoffmann, Mark D. Stitt
Proc. ASME. HT2007, ASME/JSME 2007 Thermal Engineering Heat Transfer Summer Conference, Volume 2, 365-372, July 8–12, 2007
Paper No: HT2007-32127
DOI: https://doi.org/10.1115/HT2007-32127
View Paper titled, Construction of a Broad-Based Experimental and Computational Test Capability for High Power Wide Bandgap Semiconductor Devices
Click here to open pdf in another window PDF for Construction of a Broad-Based Experimental and Computational Test Capability for High Power Wide Bandgap Semiconductor Devices
Topics: Construction, Wide band gap semiconductors, Gallium nitride, Temperature, Electron mobility, Gates (Closures), Numerical analysis, Operating temperature, Silicon, Stress