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J. Eng. Mater. Technol. October 2000, 122(4): 369. doi: https://doi.org/10.1115/1.1290396

Technical Papers

J. Eng. Mater. Technol. October 2000, 122(4): 370–375. doi: https://doi.org/10.1115/1.1288770
J. Eng. Mater. Technol. October 2000, 122(4): 376–378. doi: https://doi.org/10.1115/1.1288923
J. Eng. Mater. Technol. October 2000, 122(4): 379–383. doi: https://doi.org/10.1115/1.1288924
J. Eng. Mater. Technol. October 2000, 122(4): 384–388. doi: https://doi.org/10.1115/1.1288925
J. Eng. Mater. Technol. October 2000, 122(4): 389–393. doi: https://doi.org/10.1115/1.1288926
J. Eng. Mater. Technol. October 2000, 122(4): 394–401. doi: https://doi.org/10.1115/1.1289022
J. Eng. Mater. Technol. October 2000, 122(4): 402–408. doi: https://doi.org/10.1115/1.1289023
J. Eng. Mater. Technol. October 2000, 122(4): 409–414. doi: https://doi.org/10.1115/1.1289287
J. Eng. Mater. Technol. October 2000, 122(4): 415–419. doi: https://doi.org/10.1115/1.1289024
J. Eng. Mater. Technol. October 2000, 122(4): 420–424. doi: https://doi.org/10.1115/1.1289025
J. Eng. Mater. Technol. October 2000, 122(4): 425–427. doi: https://doi.org/10.1115/1.1289026
J. Eng. Mater. Technol. October 2000, 122(4): 428–433. doi: https://doi.org/10.1115/1.1289027
J. Eng. Mater. Technol. October 2000, 122(4): 434–442. doi: https://doi.org/10.1115/1.1289141
J. Eng. Mater. Technol. October 2000, 122(4): 443–449. doi: https://doi.org/10.1115/1.1289140
J. Eng. Mater. Technol. October 2000, 122(4): 450–459. doi: https://doi.org/10.1115/1.1288769
J. Eng. Mater. Technol. October 2000, 122(4): 460–468. doi: https://doi.org/10.1115/1.1288768
J. Eng. Mater. Technol. October 2000, 122(4): 469–473. doi: https://doi.org/10.1115/1.1289286
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