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Keywords: boundary-value problems
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Journal Articles
Journal:
Journal of Electronic Packaging
Article Type: Technical Briefs
J. Electron. Packag. December 2003, 125(4): 621–624.
Published Online: December 15, 2003
... . Manuscript received Oct. 2002. Associate Editor: E. Suhir. 01 Oct 2002 15 12 2003 tin copper stress analysis whiskers (crystal) substrates boundary-value problems surface mount technology integrated circuit packaging finite element analysis There are two major methods...
Journal Articles
Journal:
Journal of Electronic Packaging
Article Type: Technical Papers
J. Electron. Packag. December 2003, 125(4): 602–608.
Published Online: December 15, 2003
... in the JOURNAL OF ELECTRONIC PACKAGING . Manuscript received Feb. 2003. Associate Editor: E. Suhir. 01 Feb 2003 15 12 2003 optoelectronic devices glass stress analysis boundary-value problems packaging birefringence thermal expansion internal stresses thermal stresses In most...
Journal Articles
Zhe Zhang, Graduate Research Assistant,, E. E. Marotta, Senior Engineer/Scientist/Adjunct Professor—Thermal Development,, J. M. Ochterbeck, Associate Professor,
Journal:
Journal of Electronic Packaging
Article Type: Technical Papers
J. Electron. Packag. June 2003, 125(2): 186–191.
Published Online: June 10, 2003
... rigid indenters onto elastic layers for two cases: a spherical punch and a flat-ended circular punch. Chen and Engel 10 developed a general approximate method for the axisymmetric mixed boundary value problem for determining the contact radius for a sphere/multilayer media. The numerical results were...
Journal Articles
Journal:
Journal of Electronic Packaging
Article Type: Technical Papers
J. Electron. Packag. March 2003, 125(1): 53–58.
Published Online: March 14, 2003
... bending packaging finite element analysis boundary-value problems elliptic equations printed circuits In a number of emerging technical areas, there is a new need to bend thin plates (beams) into various shapes. For example, optical fibers are used in various communication cables. To have...
Journal Articles
J. R. Culham, Associate Professor and Director, Mem. ASME,, M. M. Yovanovich, Professor Emeritus and Principal Scientific Advisor, Fellow ASME,, T. F. Lemczyk, Project Engineer,
Journal:
Journal of Electronic Packaging
Article Type: Technical Papers
J. Electron. Packag. September 2000, 122(3): 233–239.
Published Online: September 1, 2000
.... Kelman , R. B. , 1979 , “ Least Squares Fourier Series Solutions To Boundary Value Problems ,” SIAM Rev. , 21 , No. 3. Sullhan, R., Fredholm, M., Monaghan, T., Agarwall, A., and Kozarek, B., 1991, “Thermal Modeling and Analysis of Pin Grid Arrays and Multichip Modules,” Proceedings of the 7th...