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1-6 of 6
Keywords: Micro vias
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Journal Articles
Journal:
Journal of Electronic Packaging
Article Type: Research-Article
J. Electron. Packag. March 2020, 142(1): 011009.
Paper No: EP-19-1058
Published Online: October 10, 2019
... are subjected to thermal processing [ 13 – 15 ]. Protrusion causes damage to the back-end-of-line layers, which results in the failure of 3D packaging; therefore, this phenomenon poses a substantial reliability issue that must be solved. 3D packaging micro vias reliability 19 05 2019 14...
Journal Articles
Journal:
Journal of Electronic Packaging
Article Type: Research-Article
J. Electron. Packag. December 2018, 140(4): 041002.
Paper No: EP-18-1007
Published Online: August 3, 2018
... ]. The orthogonal metal lines are arranged at two different metal layers and connected by micro-vias at the cross points. Power wires and ground wires are routed alternately with an identical pitch as in Fig. 2 . In this paper, we consider the power mesh with an area of 400 μ m × 400 μ m. The model of on-chip...
Journal Articles
Journal:
Journal of Electronic Packaging
Article Type: Review Articles
J. Electron. Packag. September 2017, 139(3): 030801.
Paper No: EP-16-1146
Published Online: June 14, 2017
... and Future Directions in MEMS ,” Exp. Mech. , 52 ( 3 ), pp. 289 – 303 . 10.1007/s11340-011-9520-1 3D packaging CSP Electronic Flexible circuits MEMS Micro vias PWB Electronics and microelectromechanical systems (MEMS) packaging refers to the housing of integrated circuits (IC...
Journal Articles
Journal:
Journal of Electronic Packaging
Article Type: Research-Article
J. Electron. Packag. March 2017, 139(1): 011001.
Paper No: EP-16-1073
Published Online: November 10, 2016
... . Manuscript received June 14, 2016; final manuscript received October 25, 2016; published online November 10, 2016. Assoc. Editor: Mehdi Asheghi. 14 06 2016 25 10 2016 Chip stacking Failure analysis Harsh environment Micro vias SOC Thermal analysis Gallium nitride (GaN) based...
Journal Articles
Mark Schultz, Fanghao Yang, Evan Colgan, Robert Polastre, Bing Dang, Cornelia Tsang, Michael Gaynes, Pritish Parida, John Knickerbocker, Timothy Chainer
Journal:
Journal of Electronic Packaging
Article Type: Research-Article
J. Electron. Packag. June 2016, 138(2): 021005.
Paper No: EP-15-1084
Published Online: April 25, 2016
... OURNAL OF E LECTRONIC P ACKAGING . Manuscript received September 14, 2015; final manuscript received March 14, 2016; published online April 25, 2016. Assoc. Editor: Mehdi Asheghi. 14 09 2015 14 03 2016 3D packaging Micro vias Improvements in high-performance two...
Journal Articles
Journal:
Journal of Electronic Packaging
Article Type: Review Articles
J. Electron. Packag. December 2014, 136(4): 040801.
Paper No: EP-14-1068
Published Online: October 15, 2014
... of this investigation. Also, the state-of-the-art, challenge, and trend of 3D integration will be presented and examined. Furthermore, supply chain readiness for high volume manufacturing (HVM) of TSVs is discussed. 3D packaging Micro vias Microsystems Underfill Wirebond The Electronics Industry has...