Stresses arising in plated through holes (PTHs) and surrounding printed wiring board (PWB) substrates due to pin forces of insertion-mount compliant-pin connectors are modeled analytically. The analytical model is based on separation of variable techniques using Fourier series representation of the pin loads, and will be calibrated in the future using both experimental measurements as well as numerical finite element results. Linear and nonlinear results are presented in this paper, to predict deformation and stresses in the assembly. Incremental load-stepping methods are used, to handle nonlinear material properties such as elastic-plastic behavior of copper and post-damage behavior of the PWB substrate. The nonlinearity of the materials is modeled with a simplified bilinear stress-strain curve. The goal is to develop mechanistic predictive models for PTH behavior under insertion forces of compliant pins, to reduce the need for highly repetitive and costly failure analysis for damage evaluation, resulting in significant cost savings to the industry as a whole.
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June 1995
Technical Papers
Reliability Issues in Plated-Through-Holes Due to Insertion-Mount Compliant-Pin Connectors
G. Ganguly,
G. Ganguly
CALCE Electronic Packaging Research Center, University of Maryland, College Park, MD 20742
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A. Dasgupta
A. Dasgupta
CALCE Electronic Packaging Research Center, University of Maryland, College Park, MD 20742
Search for other works by this author on:
G. Ganguly
CALCE Electronic Packaging Research Center, University of Maryland, College Park, MD 20742
A. Dasgupta
CALCE Electronic Packaging Research Center, University of Maryland, College Park, MD 20742
J. Electron. Packag. Jun 1995, 117(2): 147-152 (6 pages)
Published Online: June 1, 1995
Article history
Received:
August 1, 1994
Revised:
March 31, 1995
Online:
November 6, 2007
Citation
Ganguly, G., and Dasgupta, A. (June 1, 1995). "Reliability Issues in Plated-Through-Holes Due to Insertion-Mount Compliant-Pin Connectors." ASME. J. Electron. Packag. June 1995; 117(2): 147–152. https://doi.org/10.1115/1.2792082
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