A run-to-run optimization controller uses a reduced set of measurement parameters, in comparison to more general feedback controllers, to converge to the best control point for a repetitive process. A new run-to-run optimization controller is presented for the scanning fiber device used for image acquisition and display. This controller utilizes very sparse measurements to estimate a system energy measure and updates the input parameterizations iteratively within a feedforward with exact-inversion framework. Analysis, simulation, and experimental investigations on the scanning fiber device demonstrate improved scan accuracy over previous methods and automatic controller adaptation to changing operating temperature. A specific application example and quantitative error analyses are provided of a scanning fiber endoscope that maintains high image quality continuously across a 20 °C temperature rise without interruption of the 56 Hz video.
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September 2017
Research-Article
Run-to-Run Optimization Control Within Exact Inverse Framework for Scan Tracking
Ivan L. Yeoh,
Ivan L. Yeoh
Department of Mechanical Engineering,
University of Washington,
Seattle, WA 98195
e-mail: ivanyeoh@uw.edu
University of Washington,
Seattle, WA 98195
e-mail: ivanyeoh@uw.edu
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Per G. Reinhall,
Per G. Reinhall
Department of Mechanical Engineering,
University of Washington,
Seattle, WA 98195
University of Washington,
Seattle, WA 98195
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Martin C. Berg,
Martin C. Berg
Department of Mechanical Engineering,
University of Washington,
Seattle, WA 98195
University of Washington,
Seattle, WA 98195
Search for other works by this author on:
Howard J. Chizeck,
Howard J. Chizeck
Department of Electrical Engineering,
University of Washington,
Seattle, WA 98195
University of Washington,
Seattle, WA 98195
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Eric J. Seibel
Eric J. Seibel
Department of Mechanical Engineering,
University of Washington,
Seattle, WA 98195
University of Washington,
Seattle, WA 98195
Search for other works by this author on:
Ivan L. Yeoh
Department of Mechanical Engineering,
University of Washington,
Seattle, WA 98195
e-mail: ivanyeoh@uw.edu
University of Washington,
Seattle, WA 98195
e-mail: ivanyeoh@uw.edu
Per G. Reinhall
Department of Mechanical Engineering,
University of Washington,
Seattle, WA 98195
University of Washington,
Seattle, WA 98195
Martin C. Berg
Department of Mechanical Engineering,
University of Washington,
Seattle, WA 98195
University of Washington,
Seattle, WA 98195
Howard J. Chizeck
Department of Electrical Engineering,
University of Washington,
Seattle, WA 98195
University of Washington,
Seattle, WA 98195
Eric J. Seibel
Department of Mechanical Engineering,
University of Washington,
Seattle, WA 98195
University of Washington,
Seattle, WA 98195
Contributed by the Dynamic Systems Division of ASME for publication in the JOURNAL OF DYNAMIC SYSTEMS, MEASUREMENT, AND CONTROL. Manuscript received June 7, 2016; final manuscript received February 11, 2017; published online June 5, 2017. Assoc. Editor: Maurizio Porfiri.
J. Dyn. Sys., Meas., Control. Sep 2017, 139(9): 091011 (12 pages)
Published Online: June 5, 2017
Article history
Received:
June 7, 2016
Revised:
February 11, 2017
Citation
Yeoh, I. L., Reinhall, P. G., Berg, M. C., Chizeck, H. J., and Seibel, E. J. (June 5, 2017). "Run-to-Run Optimization Control Within Exact Inverse Framework for Scan Tracking." ASME. J. Dyn. Sys., Meas., Control. September 2017; 139(9): 091011. https://doi.org/10.1115/1.4036231
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