Recently, near-field scanning optical microscopy (NSOM) and its variations, which combine the scanning probe technology with optical microscopy, have been intensively applied in the study of biology, material science, surface chemistry, information storage, and nanofabrication. However, due to the serial scanning nature, the speed at which NSOM can successively records highly resolved images is rather limited. This hampers the applications of NSOM in characterizing dynamic response of particular samples. In this article, we perform systematic investigation of NSOM system parameters, which include scan rate, signal detector amplification, and illumination intensity. In this work, a model of signal flow for the NSOM system has been established to quantitatively investigate the interplay of the key process parameters and to further explore the technique solutions for high-speed NSOM imaging. The model is in good agreement with experimental results and the optimized conditions for high speed NSOM imaging are suggested.
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ASME 2004 International Mechanical Engineering Congress and Exposition
November 13–19, 2004
Anaheim, California, USA
Conference Sponsors:
- Electronic and Photonic Packaging Division
ISBN:
0-7918-4707-1
PROCEEDINGS PAPER
Towards High-Speed Near-Field Scanning Optical Microscope
Nicholas Fang,
Nicholas Fang
University of California at Berkeley
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Xiang Zhang
Xiang Zhang
University of California at Berkeley
Search for other works by this author on:
Yuan Wang
University of California at Berkeley
Cheng Sun
University of California at Berkeley
Nicholas Fang
University of California at Berkeley
Xiang Zhang
University of California at Berkeley
Paper No:
IMECE2004-61327, pp. 487-491; 5 pages
Published Online:
March 24, 2008
Citation
Wang, Y, Sun, C, Fang, N, & Zhang, X. "Towards High-Speed Near-Field Scanning Optical Microscope." Proceedings of the ASME 2004 International Mechanical Engineering Congress and Exposition. Electronic and Photonic Packaging, Electrical Systems Design and Photonics, and Nanotechnology. Anaheim, California, USA. November 13–19, 2004. pp. 487-491. ASME. https://doi.org/10.1115/IMECE2004-61327
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