A novel bending plate capacitive strain gauge is designed, fabricated, and tested to measure strain in the range of 1 to 1000 με. This silicon-based strain sensor uses a unique structural design to increase the on-axis gain through the use of a bending beam structure while attenuating signals due to cross-axis strain. A differential capacitive measurement is used to improve the output, reduce the parasitic capacitance, and eliminate the capacitance measurement error due to temperature. The device is fabricated using silicon-on-insulator (SOI) technology. Experimental results exhibit an on-axis sensitivity of 50 aF/με and attenuation of the cross-axis sensitivity to shear strain to less than 10 percent of the applied shear strain. A detailed mechanical analysis of the suspension and deflection-amplifying bent-beam capacitor will be presented. Furthermore, the capacitive plate analytical model is compared to finite element simulations and verified with experimental results. In addition, a noise assessment of the device shows the electronics noise dominates the Brownian noise.
Skip Nav Destination
ASME 2007 International Mechanical Engineering Congress and Exposition
November 11–15, 2007
Seattle, Washington, USA
Conference Sponsors:
- ASME
ISBN:
0-7918-4305-X
PROCEEDINGS PAPER
Enhanced Cross-Axis Rejection Capacitive Strain Gauge
Babak Jamshidi,
Babak Jamshidi
University of California at Berkeley, Berkeley, CA
Search for other works by this author on:
Robert G. Azevedo,
Robert G. Azevedo
University of California at Berkeley, Berkeley, CA
Search for other works by this author on:
Anand V. Jog,
Anand V. Jog
University of California at Berkeley, Berkeley, CA
Search for other works by this author on:
Albert P. Pisano
Albert P. Pisano
University of California at Berkeley, Berkeley, CA
Search for other works by this author on:
Babak Jamshidi
University of California at Berkeley, Berkeley, CA
Robert G. Azevedo
University of California at Berkeley, Berkeley, CA
Anand V. Jog
University of California at Berkeley, Berkeley, CA
Albert P. Pisano
University of California at Berkeley, Berkeley, CA
Paper No:
IMECE2007-43168, pp. 535-539; 5 pages
Published Online:
May 22, 2009
Citation
Jamshidi, B, Azevedo, RG, Jog, AV, & Pisano, AP. "Enhanced Cross-Axis Rejection Capacitive Strain Gauge." Proceedings of the ASME 2007 International Mechanical Engineering Congress and Exposition. Volume 11: Micro and Nano Systems, Parts A and B. Seattle, Washington, USA. November 11–15, 2007. pp. 535-539. ASME. https://doi.org/10.1115/IMECE2007-43168
Download citation file:
12
Views
Related Proceedings Papers
Related Articles
High Temperature Silicon Integrated Circuits and Passive Components for Commercial and Military Applications
J. Eng. Gas Turbines Power (October,1999)
Sub-Continuum Simulations of Heat Conduction in Silicon-on-Insulator Transistors
J. Heat Transfer (February,2001)
Related Chapters
Spice Model on High Frequency Vibration for CMUT Application
International Conference on Mechanical and Electrical Technology, 3rd, (ICMET-China 2011), Volumes 1–3
Diagonal Loading Level Estimation Based on Subspace
International Conference on Instrumentation, Measurement, Circuits and Systems (ICIMCS 2011)
A Novel Approach for LFC and AVR of an Autonomous Power Generating System
International Conference on Mechanical Engineering and Technology (ICMET-London 2011)