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Keywords: information loss
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Proceedings Papers

Proc. ASME. IDETC-CIE2008, Volume 1: 34th Design Automation Conference, Parts A and B, 693-700, August 3–6, 2008
Paper No: DETC2008-49708
... correlated. From every cluster only one representing point is selected for inspection. In this paper the method is further developed and multiple linear regression is used for evaluating how much of the information that is lost when discarding an inspection point. The information loss can be quantified using...
Topics: Inspection