3-Dimensional Force Curve and Dissipation Model Acquisition Using the Spectral Inversion Method in Tapping Mode AFM

Atomic force microscopy (AFM) has been a field driving at exploring nanoscale surfaces and measuring both topography as well as material properties. One of the phenomena that has attracted significant interest is tip-sample dissipation, which was initially investigated by Cleveland and coworkers [Appl. Phys. Lett. 72, 2613–2615 (1998)]. In this paper we expand on that work by developing a method to map the total conservative and non-conservative forces simultaneously in space and as a function of relative tip-sample velocity. This is accomplished through Fourier analysis performed on the response of a torsional harmonic cantilever (THC) probe, previously developed by Sahin and coworkers [Nature Nanotechnology 2, 507–514 (2007)]. The effect of a select group of AFM parameters (cantilever resonant frequency, force constant, quality factor, amplitude set point and excitation amplitude) is simulated in a feasible range of experimental conditions, which maximizes the spatial and velocity range of the oscillating tip, such that useful maps of the total force as a function of tip velocity and position can be acquired. We analyze the observed trends and propose an approach to acquire analytical models of the local tip-sample dissipative and conservative forces.