Atomic Force Microscopy (AFM) is a major imaging tool used to map surfaces down to atomic resolution. However, scanning rates in AFM are still low, and attempts to increase the speed usually end up with low-resolution pictures. In order to address this deficiency we propose a novel model that treats the scanning element as a moving continuous microcantilever, which undergoes a combined spatial motion in both the horizontal and the vertical directions. This research investigates the effect of increasing the scan speed on the dynamics and stability of a vibrating microcantilever that is governed by a specified control law. We reduce the spatio-temporal model to a rigid body two-degrees-of-freedom system, which is connected to a linear digital controller. Results demonstrate that the digital controller stabilizes the nonlinear system and enables a smooth transition from one side to the other side of the sample, needed for the scanning process.
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ASME 2007 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
September 4–7, 2007
Las Vegas, Nevada, USA
Conference Sponsors:
- Design Engineering Division and Computers and Information in Engineering Division
ISBN:
0-7918-4804-3
PROCEEDINGS PAPER
Nonlinear Dynamics and Control of the Scan Process in Atomic Force Microscopy
S. Hornstein,
S. Hornstein
Technion - Israel Institute of Technology, Haifa, Israel
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O. Gottlieb
O. Gottlieb
Technion - Israel Institute of Technology, Haifa, Israel
Search for other works by this author on:
S. Hornstein
Technion - Israel Institute of Technology, Haifa, Israel
O. Gottlieb
Technion - Israel Institute of Technology, Haifa, Israel
Paper No:
DETC2007-35066, pp. 731-740; 10 pages
Published Online:
May 20, 2009
Citation
Hornstein, S, & Gottlieb, O. "Nonlinear Dynamics and Control of the Scan Process in Atomic Force Microscopy." Proceedings of the ASME 2007 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 3: 19th International Conference on Design Theory and Methodology; 1st International Conference on Micro- and Nanosystems; and 9th International Conference on Advanced Vehicle Tire Technologies, Parts A and B. Las Vegas, Nevada, USA. September 4–7, 2007. pp. 731-740. ASME. https://doi.org/10.1115/DETC2007-35066
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