A conventional microscopy and confocal microscopy was used to enable nano-particle tracking using a three-dimensional (3-D) diffraction image pattern caused by an optical aberration. The Point Spread Function (PSF) of a particle image is known as a function of a defocus distance from a focal plane. Using the PSF of nano-particles, particle’s x and y positions as well as z-position can be obtained. A dry objective lens (40X, 0.75NA) is used to detect diffraction patterns of 500-nm fluorescent micro-spheres suspended in water solution inside a 100-μm square micro-tube. The purposes of this presented study are to investigate experimentally the 3-D PSF of fluorescent nano-particle in thick specimen and to develop the 3-D particle tracking technique using 3-D diffraction images of conventional microscopy and CLSM.
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ASME 2004 Heat Transfer/Fluids Engineering Summer Conference
July 11–15, 2004
Charlotte, North Carolina, USA
Conference Sponsors:
- Heat Transfer Division and Fluids Engineering Division
ISBN:
0-7918-4693-8
PROCEEDINGS PAPER
Nano-PTV Using Confocal Microscopy
Jae S. Park,
Jae S. Park
Texas A&M University, College Station, TX
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Chang K. Choi,
Chang K. Choi
Texas A&M University, College Station, TX
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Kenneth D. Kihm
Kenneth D. Kihm
Texas A&M University, College Station, TX
Search for other works by this author on:
Jae S. Park
Texas A&M University, College Station, TX
Chang K. Choi
Texas A&M University, College Station, TX
Kenneth D. Kihm
Texas A&M University, College Station, TX
Paper No:
HT-FED2004-56653, pp. 551-557; 7 pages
Published Online:
February 24, 2009
Citation
Park, JS, Choi, CK, & Kihm, KD. "Nano-PTV Using Confocal Microscopy." Proceedings of the ASME 2004 Heat Transfer/Fluids Engineering Summer Conference. Volume 4. Charlotte, North Carolina, USA. July 11–15, 2004. pp. 551-557. ASME. https://doi.org/10.1115/HT-FED2004-56653
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